Properties of a-Si:H films deposited by RF magnetron sputtering at 95°C

2011. D. Girginoudi, C. Tsiarapas and N. Georgoulas
Applied Surface Science, 257(9), 3898-3903, doi: 10.1016/j.apsusc.2010.11.115

Abstract: In this work we have investigated the dependence of optical and electrical properties of RF sputtered undopeda-Si:H films and B or P doped a-Si:H films on hydrogen flow rate (FH). Low deposition temperature of 95 °C was used, a process compatible with low-cost plastic substrates. FTIR spectroscopy and ESR measurements were used for the investigation of Si–Hx bonding configurations, and concentrations of hydrogen and dangling bonds. We found that there is a strong correlation between the total hydrogen concentration, the dangling bonds density and the optoelectronic properties of the films. The best photosensitivity value was found to be 1.4 × 104 for the undoped films. The dark conductivity (σD) of the doped layers varied from 5.9 × 10−8 to 6.5 × 10−6 (Ω cm)−1 for different ratios FAr/FH. These variations are attributed to both the different B and P concentrations in the films (according to SIMS measurements) and the enhanced disorder of the films introduced by the large number of inactive impurities. The B doping efficiency is lower compared to the P one. A small photovoltaic effect is also observed in n–i–p solar cells fabricated on polyimide (PI) substrates having ITO as antireflective coating, with an efficiency of 1.54%.

Keywords: Amorphous silicon, Low temperature sputtering, Doping, Structural-optoelectronic properties, Solar cells