Width dependent degradation of polycrystalline silicon TFTs

G.P.Kontogiannopoulos, F.V.Farmakis, D.N.Kouvatsos, G.J.Papaioannou, A.T.Voutsas
2008. Proc. 26th Intern. Conf. on Microelectronics (MIEL), Nis, Serbia, May 11-14, 2008, 2, 549